results for au:Sudhakar_P in:cs

- Apr 21 2017 cs.CV arXiv:1704.06040v1The ability to automatically learn task specific feature representations has led to a huge success of deep learning methods. When large training data is scarce, such as in medical imaging problems, transfer learning has been very effective. In this paper, we systematically investigate the process of transferring a Convolutional Neural Network, trained on ImageNet images to perform image classification, to kidney detection problem in ultrasound images. We study how the detection performance depends on the extent of transfer. We show that a transferred and tuned CNN can outperform a state-of-the-art feature engineered pipeline and a hybridization of these two techniques achieves 20\% higher performance. We also investigate how the evolution of intermediate response images from our network. Finally, we compare these responses to state-of-the-art image processing filters in order to gain greater insight into how transfer learning is able to effectively manage widely varying imaging regimes.
- Dec 09 2016 cs.CV arXiv:1612.02575v1Typical convolutional neural networks (CNNs) have several millions of parameters and require a large amount of annotated data to train them. In medical applications where training data is hard to come by, these sophisticated machine learning models are difficult to train. In this paper, we propose a method to reduce the inherent complexity of CNNs during training by exploiting the significant redundancy that is noticed in the learnt CNN filters. Our method relies on finding a small set of filters and mixing coefficients to derive every filter in each convolutional layer at the time of training itself, thereby reducing the number of parameters to be trained. We consider the problem of 3D lung nodule segmentation in CT images and demonstrate the effectiveness of our method in achieving good results with only few training examples.
- The implicit objective of the biennial "international - Traveling Workshop on Interactions between Sparse models and Technology" (iTWIST) is to foster collaboration between international scientific teams by disseminating ideas through both specific oral/poster presentations and free discussions. For its second edition, the iTWIST workshop took place in the medieval and picturesque town of Namur in Belgium, from Wednesday August 27th till Friday August 29th, 2014. The workshop was conveniently located in "The Arsenal" building within walking distance of both hotels and town center. iTWIST'14 has gathered about 70 international participants and has featured 9 invited talks, 10 oral presentations, and 14 posters on the following themes, all related to the theory, application and generalization of the "sparsity paradigm": Sparsity-driven data sensing and processing; Union of low dimensional subspaces; Beyond linear and convex inverse problem; Matrix/manifold/graph sensing/processing; Blind inverse problems and dictionary learning; Sparsity and computational neuroscience; Information theory, geometry and randomness; Complexity/accuracy tradeoffs in numerical methods; Sparsity? What's next?; Sparse machine learning and inference.
- Jun 26 2014 cs.CV arXiv:1406.6425v2Light rays incident on a transparent object of uniform refractive index undergo deflections, which uniquely characterize the surface geometry of the object. Associated with each point on the surface is a deflection map (or spectrum) which describes the pattern of deflections in various directions. This article presents a novel method to efficiently acquire and reconstruct sparse deflection spectra induced by smooth object surfaces. To this end, we leverage the framework of Compressed Sensing (CS) in a particular implementation of a schlieren deflectometer, i.e., an optical system providing linear measurements of deflection spectra with programmable spatial light modulation patterns. We design those modulation patterns on the principle of spread spectrum CS for reducing the number of observations. The ability of our device to simultaneously observe the deflection spectra on a dense discretization of the object surface is related to a Multiple Measurement Vector (MMV) model. This scheme allows us to estimate both the noise power and the instrumental point spread function. We formulate the spectrum reconstruction task as the solving of a linear inverse problem regularized by an analysis sparsity prior using a translation invariant wavelet frame. Our results demonstrate the capability and advantages of using a CS based approach for deflectometric imaging both on simulated data and experimental deflectometric data. Finally, the paper presents an extension of our method showing how we can extract the main deflection direction in each point of the object surface from a few compressive measurements, without needing any costly reconstruction procedures. This compressive characterization is then confirmed with experimental results on simple plano-convex and multifocal intra-ocular lenses studying the evolution of the main deflection as a function of the object point location.
- Dec 04 2012 cs.CV arXiv:1212.0433v1Schlieren deflectometry aims at characterizing the deflections undergone by refracted incident light rays at any surface point of a transparent object. For smooth surfaces, each surface location is actually associated with a sparse deflection map (or spectrum). This paper presents a novel method to compressively acquire and reconstruct such spectra. This is achieved by altering the way deflection information is captured in a common Schlieren Deflectometer, i.e., the deflection spectra are indirectly observed by the principle of spread spectrum compressed sensing. These observations are realized optically using a 2-D Spatial Light Modulator (SLM) adjusted to the corresponding sensing basis and whose modulations encode the light deviation subsequently recorded by a CCD camera. The efficiency of this approach is demonstrated experimentally on the observation of few test objects. Further, using a simple parametrization of the deflection spectra we show that relevant key parameters can be directly computed using the measurements, avoiding full reconstruction.