Computational Physics (physics.comp-ph)

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    We present in this work a new reconstruction scheme, so-called MUSCL-THINC-BVD scheme, to solve the five-equation model for interfacial two phase flows. This scheme employs the traditional shock capturing MUSCL (Monotone Upstream-centered Schemes for Conservation Law) scheme as well as the interface sharpening THINC (Tangent of Hyperbola for INterface Capturing) scheme as two building-blocks of spatial reconstruction using the BVD (boundary variation diminishing) principle that minimizes the variations (jumps) of the reconstructed variables at cell boundaries, and thus effectively reduces the numerical dissipations in numerical solutions. The MUSCL-THINC-BVD scheme is implemented to all state variables and volume fraction, which realizes the consistency among volume fraction and other physical variables. Benchmark tests are carried out to verify the capability of the present method in capturing the material interface as a well-defined sharp jump in volume fraction, as well as significant improvement in solution quality. The proposed scheme is a simple and effective method of practical significance for simulating compressible interfacial multiphase flows.
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    Laterally periodic nanostructures were investigated with grazing incidence small angle X-ray scattering (GISAXS) by using the diffraction patterns to reconstruct the surface shape. To model visible light scattering, rigorous calculations of the near and far field by numerically solving Maxwell's equations with a finite-element method are well established. The application of this technique to X-rays is still challenging, due to the discrepancy between incident wavelength and finite-element size. This drawback vanishes for GISAXS due to the small angles of incidence, the conical scattering geometry and the periodicity of the surface structures, which allows a rigorous computation of the diffraction efficiencies with sufficient numerical precision. To develop dimensional metrology tools based on GISAXS, lamellar gratings with line widths down to 55 nm were produced by state-of-the-art e-beam lithography and then etched into silicon. The high surface sensitivity of GISAXS in conjunction with a Maxwell solver allows a detailed reconstruction of the grating line shape also for thick, non-homogeneous substrates. The reconstructed geometrical line shape models are statistically validated by applying a Markov chain Monte Carlo (MCMC) sampling technique which reveals that GISAXS is able to reconstruct critical parameters like the widths of the lines with sub-nm uncertainty.

Recent comments

Salvatore Mandrà Nov 21 2014 13:50 UTC

The manuscript has been widely revised to focus the reader's attention on the proposed method and its application in presence of local disorder.


Salvatore, Gian Giacomo and Alán

Salvatore Mandrà Aug 01 2014 19:11 UTC

Thanks Dr. Hastings for your comment. It is true that the transverse field Ising model does not satisfy the requirements to apply our method with an exponential reduction. Indeed, the opposite would be quite impressive since the random Ising model is a NP-Hard problem and we ourselves would be prett

Matt Hastings Aug 01 2014 16:43 UTC

The "quite general" conditions seem not to include the transverse field Ising model, the subject of most of the intensive numerical work previously. Incidentally, the terms "Lanczos" and "Krylov subspace" might be helpful.

Steve Flammia Jan 10 2014 08:01 UTC

This paper is an important first step towards making numerical and computational studies more easily checkable and reproducible. Very interesting stuff.

Noon van der Silk Jan 10 2014 16:26 UTC

Interestingly, another thematically-similar paper popped up today - (posting the link here as I assume not many people are subbed to cs.DL)